Agarwal, Kanak: шукати на сайті Z-Library

Найбільша колекція наукових статей у сіті. 70,000,000+ безкоштовних статей.

Пожертвування 15 вересня 2024 – 1 жовтня 2024

Z-Library - одна з найбільших онлайн-бібліотек у світі, в якій зберігається більше 17,000,000 книг та 84,837,000 статей. Ми намагаємось зробити літературу доступною кожному. Сьогодні (15 вересня 2024) ми відкриваємо додатковий збір пожертвувань на підтримку та розвиток проекту.

Також БЕЗЛІМТНІ завантаження (протягом 31 дня після завершення пожертвування) доступні для ВСІХ користувачів, які підтримають проект в період збору коштів до 1 жовтня 2024.

Про збір коштів Детальніше

Підтримати

Книги
Статті (70)
Найпопулярніші
Перелік
- Перелік
- Таблиця

Methods for joint optimization of mask and design targets for improving lithographic process window

Banerjee, Shayak, Agarwal, Kanak B., Orshansky, Michael

Журнал:

Journal of Micro/Nanolithography MEMS and MOEMS

Рік:

2013

Мова:

english

Файл:

PDF, 5.05 MB

english, 2013

[IEEE 2010 IEEE Symposium on VLSI Circuits - Honolulu, HI, USA (2010.06.16-2010.06.18)] 2010 Symposium on VLSI Circuits - In-situ measurement of variability in 45-nm SOI embedded DRAM arrays

Agarwal, Kanak, Hayes, Jerry, Barth, John, Jacunski, Mark, Nowka, Kevin, Kirihata, Toshiaki, Iyer, Subramanian

Рік:

2010

Мова:

english

Файл:

PDF, 1.38 MB

english, 2010

[IEEE 2011 IEEE Custom Integrated Circuits Conference - CICC 2011 - San Jose, CA, USA (2011.09.19-2011.09.21)] 2011 IEEE Custom Integrated Circuits Conference (CICC) - Electrically-driven retargeting for nanoscale layouts

Banerjee, Shayak, Agarwal, Kanak B., Nassif, Sani R.

Рік:

2011

Мова:

english

Файл:

PDF, 975 KB

english, 2011

[IEEE 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2011.11.7-2011.11.10)] 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - A framework for double patterning-enabled design

Ghaida, Rani S., Agarwal, Kanak B., Nassif, Sani R., Yuan, Xin, Liebmann, Lars W., Gupta, Puneet

Рік:

2011

Мова:

english

Файл:

PDF, 1.22 MB

english, 2011

[IEEE 2012 17th Asia and South Pacific Design Automation Conference (ASP-DAC) - Sydney, Australia (2012.01.30-2012.02.2)] 17th Asia and South Pacific Design Automation Conference - Design-patterning co-optimization of SRAM robustness for double patterning lithography

Joshi, Vivek, Agarwal, Kanak, Sylvester, Dennis

Рік:

2012

Мова:

english

Файл:

PDF, 2.19 MB

english, 2012

Shape slack: a design-manufacturing co-optimization methodology using tolerance information

Banerjee, Shayak, Agarwal, Kanak B., Nassif, Sani, Orshansky, Michael

Журнал:

Journal of Micro/Nanolithography MEMS and MOEMS

Рік:

2013

Мова:

english

Файл:

PDF, 2.25 MB

english, 2013

[IEEE 2010 IEEE Custom Integrated Circuits Conference -CICC 2010 - San Jose, CA, USA (2010.09.19-2010.09.22)] IEEE Custom Integrated Circuits Conference 2010 - Ground rule slack aware tolerance-driven optical proximity correction for local metal interconnects

Banerjee, Shayak, Agarwal, Kanak, Orshansky, Michael

Рік:

2010

Мова:

english

Файл:

PDF, 252 KB

english, 2010

[IEEE 2014 IEEE International Conference on Web Services (ICWS) - Anchorage, AK, USA (2014.6.27-2014.7.2)] 2014 IEEE International Conference on Web Services - Wire-Speed Differential SOAP Encoding

Agarwal, Kanak

Рік:

2014

Мова:

english

Файл:

PDF, 772 KB

english, 2014

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Design for Manufacturability through Design-Process Integration VI - A novel methodology for triple/multiple-patterning layout decomposition

Ghaida, Rani S., Agarwal, Kanak B., Liebmann, Lars W., Nassif, Sani R., Gupta, Puneet, Mason, Mark E.

Рік:

2012

Мова:

english

Файл:

PDF, 520 KB

english, 2012

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 27 February 2011)] Design for Manufacturability through Design-Process Integration V - Integrated model-based retargeting and optical proximity correction

Agarwal, Kanak B., Rieger, Michael L., Banerjee, Shayak

Рік:

2011

Мова:

english

Файл:

PDF, 425 KB

english, 2011

[IEEE 2007 44th ACM/IEEE Design Automation Conference - San Diego, CA, USA (2007.06.4-2007.06.8)] 2007 44th ACM/IEEE Design Automation Conference - Characterizing Process Variation in Nanometer CMOS

Agarwal, Kanak, Nassif, Sani

Рік:

2007

Мова:

english

Файл:

PDF, 892 KB

english, 2007

Variability in nanometer CMOS: Impact, analysis, and minimization

Dennis Sylvester, Kanak Agarwal, Saumil Shah

Журнал:

Integration, the VLSI Journal

Рік:

2008

Мова:

english

Файл:

PDF, 1.62 MB

english, 2008

[IEEE 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Oxnard, CA, USA (2009.03.30-2009.04.2)] 2009 IEEE International Conference on Microelectronic Test Structures - A Test Structure for Assessing Individual Contact Resistance

Liu, Frank, Agarwal, Kanak

Рік:

2009

Мова:

english

Файл:

PDF, 1.28 MB

english, 2009

[IEEE 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2011.11.7-2011.11.10)] 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Accelerated statistical simulation via on-demand Hermite spline interpolations

Kanj, Rouwaida, Li, Tong, Joshi, Rajiv, Agarwal, Kanak, Sadigh, Ali, Winston, David, Nassif, Sani

Рік:

2011

Мова:

english

Файл:

PDF, 980 KB

english, 2011

Rigorous Extraction of Process Variations for 65-nm CMOS Design

Zhao, Wei, Liu, Frank, Agarwal, Kanak, Acharyya, Dhruva, Nassif, Sani R., Nowka, Kevin J., Cao, Yu

Журнал:

IEEE Transactions on Semiconductor Manufacturing

Рік:

2009

Мова:

english

Файл:

PDF, 1.20 MB

english, 2009

[IEEE 2007 IEEE Symposium on VLSI Circuits - Kyoto, Japan (2007.06.14-2007.06.16)] 2007 IEEE Symposium on VLSI Circuits - A 5.3GHz 8T-SRAM with Operation Down to 0.41V in 65nm CMOS

Chang, Leland, Nakamura, Yutaka, Montoye, Robert K., Sawada, Jun, Martin, Andrew K., Kinoshita, Kiyofumi, Gebara, Fadi H., Agarwal, Kanak B., Acharyya, Dhruva J., Haensch, Wilfried, Hosokawa, Kohji, J

Рік:

2007

Мова:

english

Файл:

PDF, 2.50 MB

english, 2007

[IEEE 2013 IEEE 24th International Conference on Application-specific Systems, Architectures and Processors (ASAP) - Washington, DC, USA (2013.06.5-2013.06.7)] 2013 IEEE 24th International Conference on Application-Specific Systems, Architectures and Processors - A high-speed and large-scale dictionary matching engine for Information Extraction systems

Agarwal, Kanak, Polig, Raphael

Рік:

2013

Мова:

english

Файл:

PDF, 1.13 MB

english, 2013

[ACM Press the 42nd annual conference - San Diego, California, USA (2005.06.13-2005.06.17)] Proceedings of the 42nd annual conference on Design automation - DAC '05 - Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance

Srivastava, Ashish, Shah, Saumil, Agarwal, Kanak, Sylvester, Dennis, Blaauw, David, Director, Stephen

Рік:

2005

Мова:

english

Файл:

PDF, 1.20 MB

english, 2005

[IEEE 2007 IEEE International Conference on Microelectronic Test Structures - Bunkyo-ku, Japan (2007.03.19-2007.03.22)] 2007 IEEE International Conference on Microelectronic Test Structures - Rapid Characterization of Threshold Voltage Fluctuation in MOS Devices

Agarwal, Kanak, Nassif, Sani, Liu, Frank, Hayes, Jerry, Nowka, Kevin

Рік:

2007

Мова:

english

Файл:

PDF, 3.53 MB

english, 2007

[IEEE ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Rigorous extraction of process variations for 65nm CMOS design

Wei Zhao,, Yu Cao,, Liu, Frank, Kanak Agarwal,, Dhruva Acharyya,, Sani Nassif,, Nowka, Kevin

Рік:

2007

Мова:

english

Файл:

PDF, 361 KB

english, 2007

[IEEE 2011 International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2011.03.14-2011.03.16)] 2011 12th International Symposium on Quality Electronic Design - Measuring within-die spatial variation profile through power supply current measurements

Plusquellic, Jim, Acharyya, Dhruva, Agarwal, Kanak

Рік:

2011

Мова:

english

Файл:

PDF, 607 KB

english, 2011

[IEEE 2012 IEEE International Conference on IC Design & Technology (ICICDT) - Austin, TX, USA (2012.05.30-2012.06.1)] 2012 IEEE International Conference on IC Design & Technology - O(n) layout-coloring for multiple-patterning lithography and conflict-removal using compaction

Ghaida, Rani S., Agarwal, Kanak B., Nassif, Sani R., Yuan, Xin, Liebmann, Lars W., Gupta, Puneet

Рік:

2012

Мова:

english

Файл:

PDF, 1.93 MB

english, 2012

[IEEE Comput. Soc 21st International Conference on Computer Design - San Jose, CA, USA (13-15 Oct. 2003)] Proceedings 21st International Conference on Computer Design - Optimal inductance for on-chip RLC interconnections

Shidhartha Das,, Kanak Agarwal,, Blaauw, D., Sylvester, D.

Рік:

2003

Мова:

english

Файл:

PDF, 319 KB

english, 2003

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Leveraging existing power control circuits and power delivery architecture for variability measurement

Acharyya, Dhruva, Agarwal, Kanak, Plusquellic, Jim

Рік:

2010

Мова:

english

Файл:

PDF, 1.83 MB

english, 2010

A Simplified Design Model for Random Process Variability

Wang, Victoria, Agarwal, Kanak, Nassif, Sani R., Nowka, Kevin J., Markovic, Dejan

Журнал:

IEEE Transactions on Semiconductor Manufacturing

Рік:

2009

Мова:

english

Файл:

PDF, 892 KB

english, 2009

Dynamically Pulsed MTCMOS With Bus Encoding for Reduction of Total Power and Crosstalk Noise

Singh, Harmander, Rao, Rahul, Agarwal, Kanak, Sylvester, Dennis, Brown, Richard

Журнал:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Рік:

2010

Мова:

english

Файл:

PDF, 406 KB

english, 2010

[IEEE 2012 IEEE International Conference on IC Design & Technology (ICICDT) - Austin, TX, USA (2012.05.30-2012.06.1)] 2012 IEEE International Conference on IC Design & Technology - Design driven patterning optimizations for low K1 lithography

Agarwal, Kanak, Banerjee, Shayak

Рік:

2012

Мова:

english

Файл:

PDF, 978 KB

english, 2012

[IEEE 2007 IEEE/ACM International Conference on Computer-Aided Design - San Jose, CA, USA (2007.11.4-2007.11.8)] 2007 IEEE/ACM International Conference on Computer-Aided Design - Efficient computation of current flow in signal wires for reliability analysis

Agarwal, Kanak, Liu, Frank

Рік:

2007

Мова:

english

Файл:

PDF, 907 KB

english, 2007

[IEEE 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2011.11.7-2011.11.10)] 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations

Lamech, Charles, Aarestad, James, Plusquellic, Jim, Rad, Reza, Agarwal, Kanak

Рік:

2011

Мова:

english

Файл:

PDF, 1.26 MB

english, 2011

[IEEE 2010 15th Asia and South Pacific Design Automation Conference ASP-DAC 2010 - Taipei, Taiwan (2010.01.18-2010.01.21)] 2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) - Analyzing electrical effects of RTA-driven local anneal temperature variation

Joshi, Vivek, Agarwal, Kanak, Sylvester, Dennis, Blaauw, David

Рік:

2010

Мова:

english

Файл:

PDF, 351 KB

english, 2010

[IEEE ESSDERC 2007 - 37th European Solid State Device Research Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSDERC 2007 - 37th European Solid State Device Research Conference - Rigorous extraction of process variations for 65nm CMOS design

Wei Zhao,, Yu Cao,, Liu, Frank, Agarwal, Kanak, Dhruva Acharyya,, Nassif, Sani, Nowka, Kevin

Рік:

2007

Мова:

english

Файл:

PDF, 361 KB

english, 2007

Technique for the Rapid Characterization of Parametric Distributions

Hayes, Jerry D., Agarwal, Kanak, Nassif, Sani R.

Журнал:

IEEE Transactions on Semiconductor Manufacturing

Рік:

2009

Мова:

english

Файл:

PDF, 824 KB

english, 2009

[IEEE 2008 IEEE Custom Integrated Circuits Conference - CICC 2008 - San Jose, CA, USA (2008.09.21-2008.09.24)] 2008 IEEE Custom Integrated Circuits Conference - Characterization and design for variability and reliability

Nowka, Kevin, Nassif, Sani, Agarwal, Kanak

Рік:

2008

Мова:

english

Файл:

PDF, 1.09 MB

english, 2008

[IEEE 8th International Symposium on Quality Electronic Design (ISQED'07) - San Jose, CA, USA (2007.03.26-2007.03.28)] 8th International Symposium on Quality Electronic Design (ISQED'07) - Dynamic Power Management by Combination of Dual Static Supply Voltages

Agarwal, Kanak, Nowka, Kevin

Рік:

2007

Мова:

english

Файл:

PDF, 316 KB

english, 2007

[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Simultaneous extraction of effective gate length and low-field mobility in non-uniform devices

Joshi, Vivek, Agarwal, Kanak, Sylvester, Dennis

Рік:

2010

Мова:

english

Файл:

PDF, 9.16 MB

english, 2010

[IEEE 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2010.11.7-2010.11.11)] 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Analysis and optimization of SRAM robustness for double patterning lithography

Joshi, Vivek, Agarwal, Kanak, Blaauw, David, Sylvester, Dennis

Рік:

2010

Мова:

english

Файл:

PDF, 3.72 MB

english, 2010

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - A methodology for propagating design tolerances to shape tolerances for use in manufacturing

Banerjee, Shayak, Agarwal, Kanak B, Chin-Ngai Sze,, Nassif, Sani, Orshansky, Michael

Рік:

2010

Мова:

english

Файл:

PDF, 283 KB

english, 2010

[IEEE 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2010.11.7-2010.11.11)] 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Active learning framework for post-silicon variation extraction and test cost reduction

Zhuo, Cheng, Agarwal, Kanak, Blaauw, David, Sylvester, Dennis

Рік:

2010

Мова:

english

Файл:

PDF, 3.20 MB

english, 2010

[IEEE 2011 International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2011.03.14-2011.03.16)] 2011 12th International Symposium on Quality Electronic Design - Coupling timing objectives with optical proximity correction for improved timing yield

Banerjee, Shayak, Agarwal, Kanak B., Nassif, Sani R., Culp, James A., Liebmann, Lars W., Orshansky, Michael

Рік:

2011

Мова:

english

Файл:

PDF, 517 KB

english, 2011

[IEEE 2009 10th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2009.03.16-2009.03.18)] 2009 10th International Symposium on Quality of Electronic Design - The impact of BEOL lithography effects on the SRAM cell performance and yield

Zhou, Ying, Kanj, Rouwaida, Agarwal, Kanak, Zhuo Li,, Joshi, Rajiv, Nassif, Sani, Shi, Weiping

Рік:

2009

Мова:

english

Файл:

PDF, 579 KB

english, 2009

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Rapid characterization of parametric distributions using a multi-meter

Hayes, Jerry, Agarwal, Kanak, Nassif, Sani

Рік:

2008

Мова:

english

Файл:

PDF, 254 KB

english, 2008

[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - A Design Model for Random Process Variability

Wang, Victoria, Agarwal, Kanak, Nassif, Sani, Nowka, Kevin, Markovic, Dejan

Рік:

2008

Мова:

english

Файл:

PDF, 364 KB

english, 2008

[IEEE 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2010.11.7-2010.11.11)] 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - SMATO: Simultaneous mask and target optimization for improving lithographic process window

Banerjee, Shayak, Agarwal, Kanak B., Orshansky, Michael

Рік:

2010

Мова:

english

Файл:

PDF, 966 KB

english, 2010

[ACM Press the 20th symposium - Providence, Rhode Island, USA (2010.05.16-2010.05.18)] Proceedings of the 20th symposium on Great lakes symposium on VLSI - GLSVLSI '10 - On-die sensors for measuring process and environmental variations in integrated circuits

Agarwal, Kanak

Рік:

2010

Мова:

english

Файл:

PDF, 844 KB

english, 2010

[ACM Press the 2008 international symposium - Portland, Oregon, USA (2008.04.13-2008.04.16)] Proceedings of the 2008 international symposium on Physical design - ISPD '08 - Stress aware layout optimization

Joshi, Vivek, Cline, Brian, Sylvester, Dennis, Blaauw, David, Agarwal, Kanak

Рік:

2008

Мова:

english

Файл:

PDF, 330 KB

english, 2008

[ACM Press the third workshop - Chicago, Illinois, USA (2014.08.22-2014.08.22)] Proceedings of the third workshop on Hot topics in software defined networking - HotSDN '14 - Shadow MACs

Agarwal, Kanak, Dixon, Colin, Rozner, Eric, Carter, John

Рік:

2014

Мова:

english

Файл:

PDF, 932 KB

english, 2014

Layout Decomposition and Legalization for Double-Patterning Technology

Ghaida, Rani S., Agarwal, Kanak B., Nassif, Sani R., Yuan, Xin, Liebmann, Lars W., Gupta, Puneet

Журнал:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Рік:

2013

Мова:

english

Файл:

PDF, 8.79 MB

english, 2013

[ACM Press the 2004 international symposium - Newport Beach, California, USA (2004.08.09-2004.08.11)] Proceedings of the 2004 international symposium on Low power electronics and design - ISLPED '04 - Approaches to run-time and standby mode leakage reduction in global buses

Rao, Rahul, Agarwal, Kanak, Sylvester, Dennis, Brown, Richard, Nowka, Kevin, Nassif, Sani

Рік:

2004

Мова:

english

Файл:

PDF, 273 KB

english, 2004

[ACM Press the 2005 conference - Shanghai, China (2005.01.18-2005.01.21)] Proceedings of the 2005 conference on Asia South Pacific design automation - ASP-DAC '05 - Achieving continuous V T performance in a dual V T process

Agarwal, Kanak, Sylvester, Dennis, Blaauw, David, Devgan, Anirudh

Рік:

2005

Мова:

english

Файл:

PDF, 520 KB

english, 2005

[ACM Press the 45th annual conference - Anaheim, California (2008.06.08-2008.06.13)] Proceedings of the 45th annual conference on Design automation - DAC '08 - Leakage power reduction using stress-enhanced layouts

Joshi, Vivek, Cline, Brian, Sylvester, Dennis, Blaauw, David, Agarwal, Kanak

Рік:

2008

Мова:

english

Файл:

PDF, 772 KB

english, 2008